Serial Number
44025
Course Number
OE5045
Course Identifier
941 U0550
No Class
- 3 Credits
Elective
GRADUATE INSTITUTE OF ELECTRICAL ENGINEERING / GRADUATE INSTITUTE OF PHOTONICS AND OPTOELECTRONICS
GRADUATE INSTITUTE OF ELECTRICAL ENGINEERING
GRADUATE INSTITUTE OF PHOTONICS AND OPTOELECTRONICS
Elective- YI-CHUN CHIN
- View Courses Offered by Instructor
COMMON GENERAL EDUCATION CENTER Global Undergraduate Program in Semiconductors
- Fri 2, 3, 4
博理214
Type 1
20 Student Quota
NTU 20
No Specialization Program
- English
- NTU COOL
- Core Capabilities and Curriculum Planning
- Notes
The course is conducted in English。
NTU Enrollment Status
Enrolled0/20Other Depts0/0Remaining0Registered0- Course DescriptionModern semiconductor research and industries are involving multiple advanced technology to characterize the material properties with ultra-high precision. This course will cover a wide variety of analytical tools utilizing cutting-edge physics and chemistry technology. The course is divided into 2 groups and 8 modules: 1 Topography and Morphology 1.1 X-ray diffraction techniques 1.2 Scanning electron microscopy/Transmission electron microscopy 1.3 Scanning probe microscopy 2 Energetics and Chemical Properties 2.1 Element analysis 2.2 Kelvin probe technique 2.3 Photoemission spectroscopy 2.4 Vibrational spectroscopy 2.5 Thermal analysis: DSC, DTA (Optional)
- Course ObjectiveStudents finishing this course are expected to be able to 1. Select relevant analytical techniques for advanced semiconducting materials 2. Interpret the analytical results and identify the limitations of the technique 3. Describe the theoretical background of each techniques and basic operational steps
- Course RequirementKnowledge of General Chemistry and General Physics
- Expected weekly study hours before and/or after class0.5 hr before class and 2.5 hr after class
- Office Hour
This course will be delivered in English and is expected students to do the final report in English *This office hour requires an appointment - Designated ReadingMaterials Characterization: Introduction to Microscopic and Spectroscopic Methods by Yang Leng
- ReferencesDavid Brandon and Wayne D. Kaplan - Microstructural characterization of materials
- Grading
30% Mid-term exam
Exams will be descriptive discussion of scientific topics
30% Final exam
Exams will be descriptive discussion of scientific topics
40% Final oral report
A presentation report about the techniques learned in this class and how it is applied in real-life scientific publications
- NTU has not set an upper limit on the percentage of A+ grades.
- NTU uses a letter grade system for assessment. The grade percentage ranges and the single-subject grade conversion table in the NATIONAL TAIWAN UNIVERSITY Regulations Governing Academic Grading are for reference only. Instructors may adjust the percentage ranges according to the grade definitions. For more information, see the Assessment for Learning Section。
- Adjustment methods for students
- Make-up Class Information
- Course Schedule