NTU Course

Analysis Techniques of Optoelectronics Materials

Offered in 114-2
  • Serial Number

    44025

  • Course Number

    OE5045

  • Course Identifier

    941 U0550

  • No Class

  • 3 Credits
  • Elective

    GRADUATE INSTITUTE OF ELECTRICAL ENGINEERING / GRADUATE INSTITUTE OF PHOTONICS AND OPTOELECTRONICS

      Elective
    • GRADUATE INSTITUTE OF ELECTRICAL ENGINEERING

    • GRADUATE INSTITUTE OF PHOTONICS AND OPTOELECTRONICS

  • YI-CHUN CHIN
  • Fri 2, 3, 4
  • 博理214

  • Type 1

  • 20 Student Quota

    NTU 20

  • No Specialization Program

  • English
  • NTU COOL
  • Core Capabilities and Curriculum Planning
  • Notes

    The course is conducted in English。

  • NTU Enrollment Status

    Enrolled
    0/20
    Other Depts
    0/0
    Remaining
    0
    Registered
    0
  • Course Description
    Modern semiconductor research and industries are involving multiple advanced technology to characterize the material properties with ultra-high precision. This course will cover a wide variety of analytical tools utilizing cutting-edge physics and chemistry technology. The course is divided into 2 groups and 8 modules: 1 Topography and Morphology 1.1 X-ray diffraction techniques 1.2 Scanning electron microscopy/Transmission electron microscopy 1.3 Scanning probe microscopy 2 Energetics and Chemical Properties 2.1 Element analysis 2.2 Kelvin probe technique 2.3 Photoemission spectroscopy 2.4 Vibrational spectroscopy 2.5 Thermal analysis: DSC, DTA (Optional)
  • Course Objective
    Students finishing this course are expected to be able to 1. Select relevant analytical techniques for advanced semiconducting materials 2. Interpret the analytical results and identify the limitations of the technique 3. Describe the theoretical background of each techniques and basic operational steps
  • Course Requirement
    Knowledge of General Chemistry and General Physics
  • Expected weekly study hours before and/or after class
    0.5 hr before class and 2.5 hr after class
  • Office Hour
    This course will be delivered in English and is expected students to do the final report in English
    *This office hour requires an appointment
  • Designated Reading
    Materials Characterization: Introduction to Microscopic and Spectroscopic Methods by Yang Leng
  • References
    David Brandon and Wayne D. Kaplan - Microstructural characterization of materials
  • Grading
    30%

    Mid-term exam

    Exams will be descriptive discussion of scientific topics

    30%

    Final exam

    Exams will be descriptive discussion of scientific topics

    40%

    Final oral report

    A presentation report about the techniques learned in this class and how it is applied in real-life scientific publications


    1. NTU has not set an upper limit on the percentage of A+ grades.
    2. NTU uses a letter grade system for assessment. The grade percentage ranges and the single-subject grade conversion table in the NATIONAL TAIWAN UNIVERSITY Regulations Governing Academic Grading are for reference only. Instructors may adjust the percentage ranges according to the grade definitions. For more information, see the Assessment for Learning Section
  • Adjustment methods for students
  • Make-up Class Information
  • Course Schedule